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Advanced optical materials: detection of polarized waves in two dimensional materials

wallpapers News 2020-07-24

polarization wave (including plasmon polarization wave phonon polarization wave exciton polarization wave) is an electromagnetic quasi particle mode formed by dipole photon coupling in materials. The polarization wave in two-dimensional materials has very high optical field binding ability which has important application prospects in enhancing the interaction between light matter modern photoelectric information devices. However in order to excite polarized waves in two-dimensional materials the prerequisite is how to make the light in free space match the polarized waves in two-dimensional materials. In order to solve this problem Dai Qing a research group of national nanoscience center of China has carried out a systematic study on the excitation detection of polarized waves in two-dimensional materials from the perspectives of far-field optics near-field optics electronic excitation In the far-field optical part

mainly show the methods based on periodic grating structure prism based attenuated total reflection nonlinear optics; in the near-field optical part the scattering scanning near-field optical microscope based on scanning probe photothermal induced resonance microscope peak force infrared microscope light induced force microscope are mainly presented In the part of electron excitation the methods of electron energy loss spectrum cathodoluminescence spectrum photoemission microscope photoinduced near field microscope are mainly presented. Generally speaking the far-field optical method represented by periodic grating structure prism attenuated total reflection method was first used in the research of two-dimensional material polarization wave widely used. This kind of method is simple suitable for a wide range of samples does not require high quality of samples but its spatial resolution is very limited (micron level) the signal is relatively weak. The near-field optical method represented by the scattering scanning near-field optical microscope is more complex. This kind of method improves the wave vector momentum of photons in free space with the help of the probe tip. At the same time it breaks the diffraction limit of the far-field method realizes the ultra-high resolution (as low as 10 nm) imaging of polarized waves in real space but it requires higher equipment. Electrical excitation methods can have higher spatial resolution (as low as 1 nm) wider excitation frequency. However the detection of low-frequency (mid infrared) polarized waves is a big challenge for such methods.

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